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Glossary



Parallelism

There are different ways of measuring parallelism. For specific information please consult the type of measurement. For example, cylindricity, flatness, straightness.

Parameter

Terms used to analyse characteristics of a measured component in quantitative terms. For example, Ra is a parameter that quantifies Roughness Average of a surface profile.

PGI

Phase Grating Interferometric transducer. This device is housed within a gauge and converts the movements of the stylus into an electrical signal. This type of transducer employs a laser diode in conjunction with a fine optical grating to detect very small movements of the stylus and provides a high resolution output of both amplitude and direction.

Pick up

Also referred to as the gauge. This can take the form of an electrical transducer which converts movement of styli into electrical signals.

Pitch

The “straight line,” or Euclidean distance, between the origin and the feature or measurement point. For example, the centres of two circle.

Plug Gauge Circle

See Maximum Inscribed Circle definition.

Primary Filter

This is a low pass filter used on the measured data in order to remove or reduce wavelengths around or below the value of this filter.

Primary Parameters

Parameters used to quantify the primary profile.

Primary Profile

The primary profile is the traced profile after subtracting the form (see Form Analysis) and subjecting it to a low pass filter.

Profile

A section taken through a workpiece. When using surface finish equipment, the profile is the trace made of the real profile. The Roughness, Waviness and Primary analyses show the modified profile.